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Proceedings Paper

Current spreading in apertured vertical-cavity lasers
Author(s): Eric R. Hegblom; Near M. Margalit; Brian Thibeault; Larry A. Coldren; John Edward Bowers
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Paper Abstract

Scaling of the threshold current density in apertured vertical cavity lasers is limited by scattering losses, current spreading, and carrier diffusion. We consider the contributions of all three effects, but focus on current spreading. We analyze a vertical cavity laser (VCL) with low scattering losses so the scaling of the threshold current density is dominated by current spreading under the aperture. We show that a simple analytic estimate (appropriate for circular geometry) for the increase in threshold matches experimental data extremely well without any fitting parameters. One can also conveniently apply the estimate of current spreading to VCLs with double apertures or multiple layers of different resistivities. We also show that current spreading should only negligibly reduce the differential efficiency as implied by experiment.

Paper Details

Date Published: 4 April 1997
PDF: 5 pages
Proc. SPIE 3003, Vertical-Cavity Surface-Emitting Lasers, (4 April 1997); doi: 10.1117/12.271065
Show Author Affiliations
Eric R. Hegblom, Univ. of California/Santa Barbara (United States)
Near M. Margalit, Univ. of California/Santa Barbara (United States)
Brian Thibeault, Univ. of California/Santa Barbara (United States)
Larry A. Coldren, Univ. of California/Santa Barbara (United States)
John Edward Bowers, Univ. of California/Santa Barbara (United States)


Published in SPIE Proceedings Vol. 3003:
Vertical-Cavity Surface-Emitting Lasers
Kent D. Choquette; Dennis G. Deppe, Editor(s)

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