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Proceedings Paper

Electrical and optical losses in dielectrically apertured vertical-cavity lasers
Author(s): Brian Thibeault; Eric R. Hegblom; Yuliya A. Akulova; Jack Ko; Ryan L. Naone; Larry A. Coldren; Philip D. Floyd
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Paper Abstract

In this paper, we measure the size dependent optical scattering and electrical losses in etched-post and dielectrically apertured vertical-cavity lasers (VCLs). We show that reduced optical scattering losses are responsible for the dramatic improvement in device scaling seen with the use of the oxide-defined apertures. Furthermore, we experimentally show how to reduce this optical scattering loss through the use of thin apertures. We find that the electrical losses (due to current leakage around the active region and carrier diffusion in the active region) in the structures are minimized by reducing the doping near the active region, minimizing the current leakage. Finally, based on the experimental results, theoretical design curves for VCL scaling are calculated.

Paper Details

Date Published: 4 April 1997
PDF: 14 pages
Proc. SPIE 3003, Vertical-Cavity Surface-Emitting Lasers, (4 April 1997); doi: 10.1117/12.271055
Show Author Affiliations
Brian Thibeault, Univ. of California/Santa Barbara (United States)
Eric R. Hegblom, Univ. of California/Santa Barbara (United States)
Yuliya A. Akulova, Univ. of California/Santa Barbara (United States)
Jack Ko, Univ. of California/Santa Barbara (United States)
Ryan L. Naone, Univ. of California/Santa Barbara (United States)
Larry A. Coldren, Univ. of California/Santa Barbara (United States)
Philip D. Floyd, Xerox Corp. (United States)

Published in SPIE Proceedings Vol. 3003:
Vertical-Cavity Surface-Emitting Lasers
Kent D. Choquette; Dennis G. Deppe, Editor(s)

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