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Proceedings Paper

Second-generation miniature ruggedized optical correlator (MROC) module
Author(s): James P. Karins; Stuart A. Mills; James R. Ryan; Robert Barry Dydyk; John R. Lucas
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Paper Abstract

The military has a requirement for small, low-power, low- cost pattern recognition systems that are capable of locating and identifying high value hostile targets. Miniature optical correlators can perform 2D pattern recognition at greater rates than digital platforms of equivalent size, power and/or weight. The patented miniature ruggedized optical correlator (MROC) can be built to meet the environmental, size, power, and weight requirements of military and rugged commercial applications, and at a cost that will permit wide deployment of the capability. The second version of the MROC correlator consists of a ferroelectric liquid crystal device in the input plane for high light efficiency and incorporates a reflective magneto optic spatial light modulator device in the filter pane for very high speed operation. The correlator has a volume of approximately 20 cubic inches. The MROC module, which includes all drive electronics and interfaces, is a 6U VME module that occupies 5 VME card slots. In this paper we will provide a brief review of the MROC construction and present sample results obtained from the MROC II breadboard. Initial tests demonstrated very high correlation levels, i.e. excellent discrimination, at pattern matching rates of 1920 per second on visible and simulated LADAR images of military vehicles and digital images of fingerprints.

Paper Details

Date Published: 27 March 1997
PDF: 10 pages
Proc. SPIE 3073, Optical Pattern Recognition VIII, (27 March 1997); doi: 10.1117/12.270358
Show Author Affiliations
James P. Karins, Litton Data Systems (United States)
Stuart A. Mills, Litton Data Systems (United States)
James R. Ryan, Litton Data Systems (United States)
Robert Barry Dydyk, Litton Data Systems (United States)
John R. Lucas, Litton Data Systems (United States)

Published in SPIE Proceedings Vol. 3073:
Optical Pattern Recognition VIII
David P. Casasent; Tien-Hsin Chao, Editor(s)

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