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Proceedings Paper

Target recognition under projective transformation
Author(s): Wei An; Zhongkang Sun; Hui Xu; Hong Li; Xiong Hui
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Paper Abstract

Projective transformation (PT) is the most general transformation in nature. However, as it is nonlinear, people haven't made great progress in the research of projective invariant. On the other hand, many researchers are confused with PT and affine transformation (AT), they used projective deformed patterns testify affine invariants without any additional explanation. This paper has thoroughly studied PT and AT. When the fixed point or fixed axis of PT is on some special positions, PT degenerates into linear form - AT. In other cases, PT can be approximated as AT under certain condition. In this paper we derived a formula of relation between them and analyzed the errors arising from this approximation. It leads a new way to recognize projective deformed patterns. Three new independent affine moment invariants composed of second- or third-order central moments are adopted for 2D and 3D target recognition. The simulation experiment reached a satisfying result.

Paper Details

Date Published: 27 March 1997
PDF: 7 pages
Proc. SPIE 3073, Optical Pattern Recognition VIII, (27 March 1997); doi: 10.1117/12.270354
Show Author Affiliations
Wei An, National Univ. of Defense Technology (China)
Zhongkang Sun, National Univ. of Defense Technology (China)
Hui Xu, National Univ. of Defense Technology (China)
Hong Li, National Univ. of Defense Technology (China)
Xiong Hui, National Univ. of Defense Technology (China)

Published in SPIE Proceedings Vol. 3073:
Optical Pattern Recognition VIII
David P. Casasent; Tien-Hsin Chao, Editor(s)

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