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Proceedings Paper

Dataspace: an automated visualization system for large databases
Author(s): Eric D. Petajan; Yves D. Jean; Dan Lieuwen; Vinod Anupam
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Paper Abstract

DataSpace is a multi-platform software system for easily visualizing relational databases using a set of flexible 3D graphics tools. Typically, five attributes are selected for a given visualization session where two of the attributes are used to generate 2D plots and the other three attributes are used to position the 2D plots in a regular 3D lattice. Mouse-based 3D navigation with constraints allows the user to see the 'forest and the trees' without getting 'lost in space'. DataSpace uses the Standard Query Language to allow connection popular database systems. DataSpace also incorporates a variety of additional tools e.g., aggregation, data 'drill down', multidimensional scaling, variable transparency, query by example, and display of graphics from external applications. Labeling of node contents is automatic. 3D strokefonts are used to provide readable yet scalable text in a 3D environment. Since interactive 3D navigation is essential to DataSpace, we have incorporated several methods for adaptively reducing graphical detail without losing information when the host machine is overloaded. DataSpace has been sued to visualized databases containing over 1 million records with interactive performance. In particular, large databases containing stock price information and telecommunications customer profiles have been analyzed using DataSpace.

Paper Details

Date Published: 9 April 1997
PDF: 10 pages
Proc. SPIE 3017, Visual Data Exploration and Analysis IV, (9 April 1997); doi: 10.1117/12.270326
Show Author Affiliations
Eric D. Petajan, Lucent Technologies Bell Labs. (United States)
Yves D. Jean, Lucent Technologies Bell Labs. (United States)
Dan Lieuwen, Lucent Technologies Bell Labs. (United States)
Vinod Anupam, Lucent Technologies Bell Labs. (United States)

Published in SPIE Proceedings Vol. 3017:
Visual Data Exploration and Analysis IV
Georges G. Grinstein; Robert F. Erbacher, Editor(s)

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