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Proceedings Paper

Optical characterization of binary, tertiary, and quaternary II-VI semiconductor thin films prepared by pulsed excimer laser deposition
Author(s): Lowell R. Matthews; Robert L. Parkhill; Edward T. Knobbe
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Paper Abstract

Pulsed lasers are becoming a popular tool for the deposition of coatings and active layers. A series of thin films composed of binary, tertiary, and quaternary II-VI semiconductors was coated onto silica substrates by the pulsed laser deposition technique, using a xenon chloride excimer laser. The semiconductor films produced by this technique included both films made from a single semiconductor target already containing the desired final stoichiometry and films made by depositing alternating layers from targets of different semiconductor compositions. The optical behaviors of the resultant films were characterized by absorption spectroscopy.

Paper Details

Date Published: 31 March 1997
PDF: 9 pages
Proc. SPIE 2992, Excimer Lasers, Optics, and Applications, (31 March 1997); doi: 10.1117/12.270084
Show Author Affiliations
Lowell R. Matthews, Oklahoma State Univ. (United States)
Robert L. Parkhill, Oklahoma State Univ. (United States)
Edward T. Knobbe, Oklahoma State Univ. (United States)

Published in SPIE Proceedings Vol. 2992:
Excimer Lasers, Optics, and Applications
Harry Shields; Peter E. Dyer, Editor(s)

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