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Proceedings Paper

Applications of high-average-power frequency-doubled Nd:YAG laser systems in material processing
Author(s): Stefan Seidel; Thomas Beck; Dagmar Schuhmacher
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Paper Abstract

A comparative study of material processing with Q-switched Nd:YAG lasers at the fundamental (1064 nm) and the second harmonic wavelength (532 nm) is presented. Two different laser-systems are used: (1) A flash-lamp pumped, phase- conjugated Nd:YAG oscillator-amplifier-system with average output powers of up to 45 W at both wavelength at a repetition rate of 100 Hz; and (2) A cw-pumped, periodically Q-switched dual-rod Nd:YAG laser with an average power of 50 W at 1064 nm and up to 18 W at 532 nm. The lasers are used for cutting of copper (Cu) with a thickness between 0.1 and 0.5 mm and percussion drilling of copper and alumina (Al) with a thickness of up to 1 mm. The material-processing efficiency is compared for nearly identical laser-parameters at both wavelengths. With the flash-lamp-pumped system cutting of Cu is possible with typically 30% higher speed at 532 nm compared to 1064 nm for average powers up to 15 W. At higher average powers the cutting speed starts to saturate at nearly the same level for both wavelength caused by plasma effects on the surface. With the cw-pumped system percussion drilling in Cu and Al is compared at different wavelengths. While drilling of copper is significantly more efficient for thicknesses above 0.5 mm using the green laser beam, the efficiency for drilling of alumina was slightly higher in the infrared.

Paper Details

Date Published: 27 March 1997
PDF: 9 pages
Proc. SPIE 2993, Lasers as Tools for Manufacturing II, (27 March 1997); doi: 10.1117/12.270020
Show Author Affiliations
Stefan Seidel, Laser- und Medizintechnologie gGmbH (Germany)
Thomas Beck, Laser- und Medizintechnologie gGmbH (Germany)
Dagmar Schuhmacher, Optisches Institut/Technische Univ. Berlin (Germany)

Published in SPIE Proceedings Vol. 2993:
Lasers as Tools for Manufacturing II
Leonard R. Migliore; Ronald D. Schaeffer, Editor(s)

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