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Proceedings Paper

New phase evaluation methods using electronic speckle pattern interferometry for deformation analysis
Author(s): Rini Widiastuti; Sanichiro John Yoshida; - Suprapedi; A. Kusnowo; M. H. br Pardede; - Rukita; S. Siahaan
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Paper Abstract

New methods of deformation analysis using electronic speckle pattern interferometry is proposed. The advantages of the measurement system are its capability to evaluate the phase data embedded in fringe pattern continuously, by simply taking speckle images and doing simple arithmetic operation on data processing stage. The methods can be applied for deformation analysis and fracture prediction technique on a loaded material. Analysis of fracture was done based on mesomechanics theory proposed by V. E. Panin. The important strength of this system is the ability of predicting a future crack on a loaded material by performing non contact and non destructive measurement system.

Paper Details

Date Published: 20 March 1997
PDF: 6 pages
Proc. SPIE 2921, International Conference on Experimental Mechanics: Advances and Applications, (20 March 1997); doi: 10.1117/12.269794
Show Author Affiliations
Rini Widiastuti, Indonesian Institute of Sciences (Indonesia)
Sanichiro John Yoshida, Indonesian Institute of Sciences (Indonesia)
- Suprapedi, Indonesian Institute of Sciences (Indonesia)
A. Kusnowo, Indonesian Institute of Sciences (Indonesia)
M. H. br Pardede, Univ. of North Sumatra (Indonesia)
- Rukita, Univ. of North Sumatra (Indonesia)
S. Siahaan, Univ. of North Sumatra (Indonesia)


Published in SPIE Proceedings Vol. 2921:
International Conference on Experimental Mechanics: Advances and Applications
Fook Siong Chau; C. T. Lim, Editor(s)

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