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Proceedings Paper

Evaluation of local contact stress/strain by moire interferometry and thin-coating photoelasticity
Author(s): Meiko Naito; Yasushi Takeuchi; Masahisa Takashi
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Paper Abstract

It is well known that there still exist several difficulties in the analysis of contact stress or strain around the region near contact because of unexpected irregular boundary data obtained by the current experimental techniques, such as Moire interferometry, in spite of highly accurate and precise information of continuous distribution of fringes inside a body. In order to overcome the type of difficulties, a combined technique with Moire interferometry and thin-coating photoelasticity is discussed to analyze stress/strain near a contact region, utilizing their features in either macro- or micro-scopic analysis of displacement and strain distribution the surface of a body.

Paper Details

Date Published: 20 March 1997
PDF: 6 pages
Proc. SPIE 2921, International Conference on Experimental Mechanics: Advances and Applications, (20 March 1997); doi: 10.1117/12.269792
Show Author Affiliations
Meiko Naito, Aoyama Gakuin Univ. (Japan)
Yasushi Takeuchi, Aoyama Gakuin Univ. (Japan)
Masahisa Takashi, Aoyama Gakuin Univ. (Japan)

Published in SPIE Proceedings Vol. 2921:
International Conference on Experimental Mechanics: Advances and Applications
Fook Siong Chau; C. T. Lim, Editor(s)

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