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Proceedings Paper

Neutron depth profiling of elemental concentration using a focused beam
Author(s): Huaiyu Heather Chen-Mayer; G. P. Lamaze; David F. R. Mildner; Robert Gregory Downing
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Paper Abstract

Neutron Depth Profiling (NDP) is a nondestructive analytical technique for measuring the concentration of certain light elements as a function of depth near the surface of a solid matrix. The concentration profile is determined by analyzing the energy spectrum of the charged particles emitted as a result of neutron capture by the elements. The measurement sensitivity is directly proportional to the neutron beam current density. A more intense neutron beam achieved by focusing improves sensitivity for specimens of small area. In addition, a narrowly focused beam adds lateral spatial resolution to the technique, which is advantageous compared with that obtained by collimating the beam size using apertures. Capillary neutron lenses have been shown to focus a neutron beam to sub-millimeter spot size. Preliminary tests have been performed in the NDP geometry using such a focusing device. A lateral resolution in the sub-millimeter range is demonstrated by a specimen of non-uniform lateral distribution composed of a row of borosilicate glass fibers.

Paper Details

Date Published: 27 February 1997
PDF: 4 pages
Proc. SPIE 2867, International Conference Neutrons in Research and Industry, (27 February 1997); doi: 10.1117/12.267885
Show Author Affiliations
Huaiyu Heather Chen-Mayer, National Institute of Standards and Technology (United States)
G. P. Lamaze, National Institute of Standards and Technology (United States)
David F. R. Mildner, National Institute of Standards and Technology (United States)
Robert Gregory Downing, X-Ray Optical Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 2867:
International Conference Neutrons in Research and Industry
George Vourvopoulos, Editor(s)

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