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Proceedings Paper

Design of optical thin film structures for information recording based on spectrophotometric data
Author(s): A. D. Leonets; D. A. Grinko
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Paper Abstract

The work describes a method of determination of complex refractive index spectra of thin films and computation modeling of optical properties of multilayer recording media. The examples of inorganic films spectra are given, the comparison of results of modeling with an experiment is conducted. The installation, enabling to conduct spectrophotometric measurements of light-sensitive recording materials in weak monochromatic flows, excluding changes of material during measurement is described.

Paper Details

Date Published: 28 February 1997
PDF: 7 pages
Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); doi: 10.1117/12.267709
Show Author Affiliations
A. D. Leonets, Institute of Information Recording Problems (Ukraine)
D. A. Grinko, Institute of Information Recording Problems (Ukraine)


Published in SPIE Proceedings Vol. 3055:
International Conference on Optical Storage, Imaging, and Transmission of Information
Viacheslav V. Petrov; Sergei V. Svechnikov, Editor(s)

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