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Proceedings Paper

Errors in x-ray intensity measurements by means of 2D position-sensitive detector
Author(s): Andrzej Wasiak; Pawel Sajkiewicz
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Paper Abstract

The aim of the present work is determination of characteristic of the 2D position sensitive detector in order to establish conditions, limitations and corrections needed for quantitative measurements of the intensity of scattered X-ray radiation. The analysis of the possibility to introduce corrections of nonuniformities in sensitivity of the detector along its surface, being responsible for distortions in the measured intensity profiles.

Paper Details

Date Published: 18 February 1997
PDF: 6 pages
Proc. SPIE 3095, X-Ray Investigations of Polymer Structures, (18 February 1997); doi: 10.1117/12.267187
Show Author Affiliations
Andrzej Wasiak, Institute of Fundamental Technological Research (Poland)
Pawel Sajkiewicz, Institute of Fundamental Technological Research (Poland)


Published in SPIE Proceedings Vol. 3095:
X-Ray Investigations of Polymer Structures
Andrzej Wlochowicz; Jaroslaw Janicki; Czeslaw Slusarczyk, Editor(s)

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