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Proceedings Paper

Reversible phase-change optical recording on SiO2-(Co+ Si)-SiO2-Si multilayer structure
Author(s): Arthur Medvids; Maris Knite; J. Kaupuzs; V. Frishfelds
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Paper Abstract

The optical properties of SiO2-(Co plus Si)-SiO2-Si structures studied by treatment with Q-switched YAG:Nd and carbon dioxide lasers are presented. The photo-thermo- chemical reaction of Co with Si has a threshold character. No change in optical properties of (Co plus Si) mixture was observed up to 2 MW/cm2 intensities of carbon dioxide laser radiation. A decrease of the reflection coefficient R from 70% to 45% is observed as the intensity is increased up to 8 MW/cm2. When this multilayer structure is subject to Q-switched YAG:Nd laser radiation of the intensity from 14 MW/cm2 to 53 MW/cm2, the magnitude of the reflection coefficient returns to its initial value 70%. It means that information recorded by carbon dioxide laser is erased. Calculations of the temperature field during irradiation with carbon dioxide and YAG:Nd laser showed that the phase transition from mixture (Co plus Si) to CoSi2 caused by carbon dioxide laser irradiation results in recording of information, whereas the thermal impact caused by YAG:Nd laser irradiation results in amorphization of CoSi2 and erasing of information.

Paper Details

Date Published: 6 February 1997
PDF: 5 pages
Proc. SPIE 2968, Optical Organic and Semiconductor Inorganic Materials, (6 February 1997); doi: 10.1117/12.266822
Show Author Affiliations
Arthur Medvids, Riga Technical Univ. (Latvia)
Maris Knite, Riga Technical Univ. (Latvia)
J. Kaupuzs, Riga Technical Univ. (Latvia)
V. Frishfelds, Riga Technical Univ. (Latvia)


Published in SPIE Proceedings Vol. 2968:
Optical Organic and Semiconductor Inorganic Materials

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