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Proceedings Paper

System for measuring thickness of opaque dielectric layers
Author(s): Ryszard Hypszer; Jerzy Plucinski; Pawel Wierzba
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Paper Abstract

The subject of this paper is a system for measuring thickness of opaque dielectric layers using the change of the coefficient of the magnetic coupling of two coils. This circuit was designed for measurements of thickness of elements in boats made from epoxy-glass laminates. It can, however, be used everywhere, where the need occurs to make non-destructive thickness measurements of dielectric layers in the range from 5 to 30 mm with an accuracy of 0,5 mm.

Paper Details

Date Published: 13 February 1997
PDF: 4 pages
Proc. SPIE 3054, Optoelectronic and Electronic Sensors II, (13 February 1997); doi: 10.1117/12.266718
Show Author Affiliations
Ryszard Hypszer, Technical Univ. of Gdansk (Poland)
Jerzy Plucinski, Technical Univ. of Gdansk (Poland)
Pawel Wierzba, Technical Univ. of Gdansk (Poland)

Published in SPIE Proceedings Vol. 3054:
Optoelectronic and Electronic Sensors II
Zdzislaw Jankiewicz; Henryk Madura, Editor(s)

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