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Proceedings Paper

Instrument for underwater high-angular resolution volume scattering function measurements
Author(s): Paul W. Dueweke; Jay Bolstad; Donald A. Leonard; Harold E. Sweeney; Philip A. Boyer; Erik M. Winkler
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Paper Abstract

A prototype instrument for in situ measurements of the volume scattering function (VSF) and the beam attenuation of water has been built and tested in the EOO laboratory. The intended application of the instrument is the enhancement of Navy operational optical systems for finding and imaging underwater objects such as mines. A description of the apparatus that was built and preliminary laboratory data will be presented. The instrument measures the VSF, (beta) ((theta) ), near the optical axis in both the forward and back directions from approximately 0.2 degrees off axis to approximately 5 degrees in 0.1 degree steps and at side angles of 45 degrees, 90 degrees, and 135 degrees. A diode- pumped, frequency-doubled, Nd:YAG laser provides the 532 nm light. This is the most used wavelength for underwater optical systems. The forward and back scattered light is collected and focused to a plane where scattering angles in the water are mapped onto concentric rings. At this focal plane, a conical reflector compresses the annular optical data onto a line along the cone axis where it is read by a MOS linear image array providing over 500 separate angular measurements. The beam attenuation coefficient, c, is also measured by means of a unique dual path configuration.

Paper Details

Date Published: 6 February 1997
PDF: 6 pages
Proc. SPIE 2963, Ocean Optics XIII, (6 February 1997); doi: 10.1117/12.266379
Show Author Affiliations
Paul W. Dueweke, EOO, Inc. (United States)
Jay Bolstad, EOO, Inc. (United States)
Donald A. Leonard, EOO, Inc. (United States)
Harold E. Sweeney, EOO, Inc. (United States)
Philip A. Boyer, Global Associates, Ltd. (United States)
Erik M. Winkler, Global Associates, Ltd. (United States)


Published in SPIE Proceedings Vol. 2963:
Ocean Optics XIII
Steven G. Ackleson; Robert J. Frouin, Editor(s)

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