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Proceedings Paper

Small-signal microwave performance of gain-coupled DFB laser array elements at 1.3 um
Author(s): Ezio Berolo; J. Bosomworth; Heng Hua; Karen A. Vineberg; G. P. Li; Hanh Lu; Toshi Makino; Frank R. Shepherd
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Paper Abstract

The small-signal microwave performance of 1.3 micrometer gain-coupled DFB lasers has been measured as a function of device parameters such as current and ridge width by treating the laser as a two port device. The s-parameters were measured over a frequency range from 0.5 GHz to 8 GHz. The simulation software LIBRA was used with S11 return loss measurements to extract equivalent circuit parameters according to Kan and Lau's laser model. Results demonstrate that the parameters describing the input impedance of the laser undergo a discontinuity at the lasing threshold current, Ith. The measured optical intensity modulation (IM) response, (S21), was used to study the behavior of the relaxation oscillation frequency fr as a function of laser bias current. It has been demonstrated that at high laser bias current Ilaser, fr is independent of laser bias current (Ilaser). We have also used the equivalent circuit parameters obtained from the S11 data to predict values for fr based on equations derived. These were then compared to the fr values obtained from S21 measurements.

Paper Details

Date Published: 30 January 1997
PDF: 12 pages
Proc. SPIE 2918, Emerging Components and Technologies for All-Optical Photonic Systems II, (30 January 1997); doi: 10.1117/12.265376
Show Author Affiliations
Ezio Berolo, Communications Research Ctr. (Canada)
J. Bosomworth, Communications Research Ctr. (Canada)
Heng Hua, Communications Research Ctr. (Canada)
Karen A. Vineberg, Communications Research Ctr. (Canada)
G. P. Li, Nortel Technology (Canada)
Hanh Lu, Nortel Technology (Canada)
Toshi Makino, Nortel Technology (Canada)
Frank R. Shepherd, Nortel Technology (Canada)

Published in SPIE Proceedings Vol. 2918:
Emerging Components and Technologies for All-Optical Photonic Systems II
Emil S. Koteles; Alan Eli Willner, Editor(s)

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