Share Email Print
cover

Proceedings Paper

Laser-based facet inspection system
Author(s): Jens Wolfgang Tomm; A. Baerwolff; Ch. Lier; Thomas Elsaesser; Franz X. Daiminger; Stefan Heinemann
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We developed a laser based inspection system which was used to monitor defect distributions in optoelectronic devices such as diode lasers. Basically the system works as the well-known laser beam induced current (LBIC) technique. Various lasers emitting in the 633-1300 nm wavelength range were employed as excitation source. A number of high power laser diode arrays (LDA) aged under different aging conditions (parameters: injection current, heat sink temperature, time) were inspected with the system. The scans obtained revealed significant differences for different aging levels of arrays. This finding allows us to determine the aging status of LDA and contributes to find methods for giving failure predictions for individual devices.

Paper Details

Date Published: 10 January 1997
PDF: 9 pages
Proc. SPIE 3000, Laser Diode and LED Applications III, (10 January 1997); doi: 10.1117/12.263481
Show Author Affiliations
Jens Wolfgang Tomm, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
A. Baerwolff, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Ch. Lier, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Thomas Elsaesser, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Franz X. Daiminger, JENOPTIK Laserdiode GmbH (Germany)
Stefan Heinemann, JENOPTIK Laserdiode GmbH (Germany)


Published in SPIE Proceedings Vol. 3000:
Laser Diode and LED Applications III
Kurt J. Linden, Editor(s)

© SPIE. Terms of Use
Back to Top