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Proceedings Paper

Research on a geometric model-based 3D inspection machine
Author(s): Jihong Chen; Huicheng Zhou; DaoShan O'yang; Shawn Buckley
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Paper Abstract

Currently only contact systems--where a probe touches the part on its surfaces--have the resolution required for inspecting in the manufacturing industry. in this paper, the development of a non-contact structured light machine vision (SLMV) inspecting system using structured light imaged by a machine vision camera given fast inspection at high resolution. The key technology of this system is inspecting simulation software using a geometric model of the inspected part. The geometric model eliminates spurious range data from multiple reflections that has plagued previous SLMV systems. In addition, the new system eliminates 99 percent of the data to be studied in detail, reducing both the pixels acquired and the pixels analyzed to just those which contribute to determining the part's dimensions. Resolution is improved by averaging many points over part's surface. Experimentally, a single-axis machine measured several dimensions of a part in less than a second to micron resolution.

Paper Details

Date Published: 20 January 1997
PDF: 8 pages
Proc. SPIE 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, (20 January 1997); doi: 10.1117/12.263325
Show Author Affiliations
Jihong Chen, Huazhong Univ. of Science and Technology (China)
Huicheng Zhou, Huazhong Univ. of Science and Technology (China)
DaoShan O'yang, Huazhong Univ. of Science and Technology (China)
Shawn Buckley, CogniSense Inc. (United States)


Published in SPIE Proceedings Vol. 2909:
Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
Kevin G. Harding; Donald J. Svetkoff, Editor(s)

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