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Proceedings Paper

Comparison of surface contour measurements based on speckle pattern sampling and coordinate measuring machines
Author(s): Gregory R. Hallerman; Lyle G. Shirley
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Paper Abstract

A noncontact 3D imaging technique based on tunable lasers is investigated to assess its performance compared to commercially available methods. In this technique, an object is flood illuminated by an external cavity tunable diode laser. As the laser frequency is scanned, the time-varying speckle-intensity pattern provides information about the depth of the scattering object. The patterns are recorded with a CCD camera, and the object's height profile is then extracted from the 3D fast Fourier transform. This paper presents the first quantitative comparison of results using this technique with those from a well-known standard instrument--the coordinate measuring machine. The object used for the comparison is a pressed sheet-metal part with dimensions of approximately 1-- by 100 by 20 mm. We found the standard deviation (sigma) of the difference between the two profiles to be less than 0.2 (Delta) z, where (Delta) z is the raw range resolution of the speckle-pattern-sampling technique.

Paper Details

Date Published: 20 January 1997
PDF: 9 pages
Proc. SPIE 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, (20 January 1997); doi: 10.1117/12.263314
Show Author Affiliations
Gregory R. Hallerman, MIT Lincoln Lab. (United States)
Lyle G. Shirley, MIT Lincoln Lab. (United States)


Published in SPIE Proceedings Vol. 2909:
Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
Kevin G. Harding; Donald J. Svetkoff, Editor(s)

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