Share Email Print

Proceedings Paper

Accurate 3D measurement using a structured light system
Author(s): Robert J. Valkenburg; Alan M. McIvor
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper discusses a method for obtaining accurate 3D measurements using a temporally encoded structured light system. An objective of the work was to have a balance in the accuracy of all components in the system. This was achieved by including lens distortion in the modes for both the camera and projector which comprise the structured light system. In addition, substripe estimation was used to estimate projector stripe values as a complement to subpixel estimators used for locating image features. Experimental evaluation shows that it is important to use substripe estimation and incorporate lens distortion in the projector model.

Paper Details

Date Published: 20 January 1997
PDF: 13 pages
Proc. SPIE 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, (20 January 1997); doi: 10.1117/12.263312
Show Author Affiliations
Robert J. Valkenburg, Industrial Research Ltd. (New Zealand)
Alan M. McIvor, Industrial Research Ltd. (New Zealand)

Published in SPIE Proceedings Vol. 2909:
Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
Kevin G. Harding; Donald J. Svetkoff, Editor(s)

© SPIE. Terms of Use
Back to Top