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Proceedings Paper

Image matching for the extension of the AFM measuring range
Author(s): Wei Wu; Jiabi Chen; Zhongcheng Liang
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Paper Abstract

This paper presents a method based on the image matching to extend the measuring range of AFM. By this way, we can extend the measuring range of AFM without changing the hardware structure of AFM system. It is proved that this method is powerful to resist the noise and the images can be matched precisely and quickly. In principle, the measuring range of AFM can be extended unlimitedly.

Paper Details

Date Published: 31 December 1996
PDF: 4 pages
Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); doi: 10.1117/12.263124
Show Author Affiliations
Wei Wu, Nanjing Normal Univ. (China)
Jiabi Chen, Nanjing Normal Univ. (China)
Zhongcheng Liang, Nanjing Normal Univ. (China)


Published in SPIE Proceedings Vol. 2866:
International Conference on Holography and Optical Information Processing (ICHOIP '96)
Guoguang Mu; Guofan Jin; Glenn T. Sincerbox, Editor(s)

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