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Proceedings Paper

Two case studies for Level Sensitive Scan Design methodology
Author(s): Celso F. V. Brites; Augusto C. F. Morais
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Paper Details

Date Published: 1 November 1990
PDF: 8 pages
Proc. SPIE 1405, 5th Congress of the Brazilian Society of Microelectronics, (1 November 1990); doi: 10.1117/12.26309
Show Author Affiliations
Celso F. V. Brites, IBM Brasil (Brazil)
Augusto C. F. Morais, IBM Brasil (Brazil)

Published in SPIE Proceedings Vol. 1405:
5th Congress of the Brazilian Society of Microelectronics

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