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Proceedings Paper

Novel method for evaluation of a thin phase hologram
Author(s): Bingheng Xiong; Zhengrong Wang; Yongan Zhang; Liyun Zhong; Wenbi Zhang; Qiming Yang
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Paper Abstract

To evaluate a hologram by measuring its optical density D, diffraction efficiency (tau) and signal-noise ratio SNR is a conventional method in holography. In this paper, a novel method is proposed for evaluation of a thin, phase holograms by testing phase modulation together with D, (tau) and SNR. Many properties of the thin, phase holograms are related to phase modulation, so that to control the value of phase modulation in making a thin, phase hologram is important. The value of the phase modulation of a hologram can be obtained by measuring the irradiance of its zero and first- order diffraction and calculating their ratio. This method will help holographers to obtain a perfect understanding of a thin, phase hologram and help them to choose the optimum parameters of exposure so as to obtain an expectation result. The theoretical analysis of this method are given and some applications are also introduced.

Paper Details

Date Published: 31 December 1996
PDF: 5 pages
Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); doi: 10.1117/12.263068
Show Author Affiliations
Bingheng Xiong, Yunnan Polytechnic Univ. (China)
Zhengrong Wang, Yunnan Polytechnic Univ. (China)
Yongan Zhang, Yunnan Polytechnic Univ. (China)
Liyun Zhong, Yunnan Polytechnic Univ. (China)
Wenbi Zhang, Yunnan Polytechnic Univ. (China)
Qiming Yang, Yunnan Polytechnic Univ. (China)


Published in SPIE Proceedings Vol. 2866:
International Conference on Holography and Optical Information Processing (ICHOIP '96)

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