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Proceedings Paper

Single defects and noise in sub-u MOSFETs
Author(s): Max J. Schulz; A. Karmann
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Paper Details

Date Published: 1 November 1990
PDF: 17 pages
Proc. SPIE 1405, 5th Congress of the Brazilian Society of Microelectronics, (1 November 1990); doi: 10.1117/12.26292
Show Author Affiliations
Max J. Schulz, Univ of Erlangen-Nuernberg (Germany)
A. Karmann, Univ of Erlangen-Nuernberg (Germany)

Published in SPIE Proceedings Vol. 1405:
5th Congress of the Brazilian Society of Microelectronics

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