Share Email Print
cover

Proceedings Paper

Fast algorithm for spectral mixture analysis of imaging spectrometer data
Author(s): Theo E. Schouten; Maurice S. Klein Gebbinck; Z. K. Liu; Shaowei Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Imaging spectrometers acquire images in many narrow spectral bands but have limited spatial resolution. Spectral mixture analysis (SMA) is used to determine the fractions of the ground cover categories (the end-members) present in each pixel. In this paper a new iterative SMA method is presented and tested using a 30 band MAIS image. The time needed for each iteration is independent of the number of bands, thus the method can be used for spectrometers with a large number of bands. Further a new method, based on K-means clustering, for obtaining endmembers from image data is described and compared with existing methods. Using the developed methods the available MAIS image was analyzed using 2 to 6 endmembers.

Paper Details

Date Published: 17 December 1996
PDF: 10 pages
Proc. SPIE 2955, Image and Signal Processing for Remote Sensing III, (17 December 1996); doi: 10.1117/12.262887
Show Author Affiliations
Theo E. Schouten, Katholieke Univ. Nijmegen (Netherlands)
Maurice S. Klein Gebbinck, Katholieke Univ. Nijmegen (Netherlands)
Z. K. Liu, Univ. of Science and Technology of China (China)
Shaowei Chen, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 2955:
Image and Signal Processing for Remote Sensing III
Jacky Desachy, Editor(s)

© SPIE. Terms of Use
Back to Top