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Proceedings Paper

Electron-beam diagnostics and emission characterization for single and multiple Spindt-type field emitters for rf amplifiers
Author(s): Puroby M. Phillips; Kevin L. Jensen; Khank Nguyen; Lex Malsawma; C. Hor; E. G. Zaidman
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Paper Abstract

Experimental measurements made on a single Spindt-type molybdenum field emitter are correlated with a simple analytic model of the electron distribution. The measurements were made by using a nanofabricated detector whose position relative to the emitted was determined using laser interferometry. Methods used to correlate theory with experiment are explained, and the dependence of the beam profile on tip sharpness, gate diameter, anode distance, and tip work function are examined. It is shown how the analytic model may be extended to find the trajectories needed for particle simulations. Analysis has shown that the rms spread angle is approximately 20 degrees.

Paper Details

Date Published: 18 December 1996
PDF: 17 pages
Proc. SPIE 2842, Millimeter and Submillimeter Waves and Applications III, (18 December 1996); doi: 10.1117/12.262771
Show Author Affiliations
Puroby M. Phillips, Naval Research Lab. (United States)
Kevin L. Jensen, Naval Research Lab. (United States)
Khank Nguyen, Naval Research Lab. (United States)
Lex Malsawma, Naval Research Lab. (United States)
C. Hor, Naval Research Lab. (United States)
E. G. Zaidman, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 2842:
Millimeter and Submillimeter Waves and Applications III
Mohammed N. Afsar, Editor(s)

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