Share Email Print
cover

Proceedings Paper

Optoelectronic sampler: modeling and characterization
Author(s): Lydie Armengaud; Michele Lalande; Nicolas Breuil; Bernard Jecko; Anne Ghis; Marc Cuzin; Maurice Nail; Phillipe Gilbert
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, an optoelectronic sampler is described. The device is made with microstrip propagation lines and ultra- rapid photoconductive switches which are integrated in the same substrate. The sampler is used to measure the output electrical signal provided by an ultra-fast detector. The detector electrical pulse lasts from 20 ps to 100 ps and is sampled every 4 ps. The total record length is 400 ps.

Paper Details

Date Published: 18 December 1996
PDF: 11 pages
Proc. SPIE 2842, Millimeter and Submillimeter Waves and Applications III, (18 December 1996); doi: 10.1117/12.262758
Show Author Affiliations
Lydie Armengaud, Univ. de Limoges (France)
Michele Lalande, Univ. de Limoges (France)
Nicolas Breuil, Univ. de Limoges (France)
Bernard Jecko, Univ. de Limoges (France)
Anne Ghis, Commissariat a l'Energie Atomique (France)
Marc Cuzin, Commissariat a l'Energie Atomique (France)
Maurice Nail, Commissariat a l'Energie Atomique (France)
Phillipe Gilbert, Commissariat a l'Energie Atomique (France)


Published in SPIE Proceedings Vol. 2842:
Millimeter and Submillimeter Waves and Applications III
Mohammed N. Afsar, Editor(s)

© SPIE. Terms of Use
Back to Top