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Proceedings Paper

High-sensitivity interferometric technique for strain measurements
Author(s): Arkady S. Voloshin; Adel F. Bastawros
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Paper Details

Date Published: 1 March 1991
PDF: 11 pages
Proc. SPIE 1400, Optical Fabrication and Testing, (1 March 1991); doi: 10.1117/12.26116
Show Author Affiliations
Arkady S. Voloshin, Lehigh Univ. (United States)
Adel F. Bastawros, Bethlehem Steel Corp. (United States)


Published in SPIE Proceedings Vol. 1400:
Optical Fabrication and Testing

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