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Proceedings Paper

Optical testing with wavelength scanning interferometer
Author(s): Katsuyuki Okada; Jumpei Tsujiuchi
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Paper Abstract

Wavelength change in a unbalanced interferometer makes phase change in interferograms, and this phenomenon can be used for the purpose of phase shifting interferometry. As an example of measurements, an optical plane parallel plate is tested, and the simultaneous measurement of both front and rear surfaces together with inhomogeneity of refractive index can be carried out. A new method for calculating phase distribution is developed under the condition where nonlinearity of tuning wavelength and fluctuation of output power take place.

Paper Details

Date Published: 1 March 1991
PDF: 5 pages
Proc. SPIE 1400, Optical Fabrication and Testing, (1 March 1991); doi: 10.1117/12.26113
Show Author Affiliations
Katsuyuki Okada, Chiba Univ. (Japan)
Jumpei Tsujiuchi, Chiba Univ. (Japan)

Published in SPIE Proceedings Vol. 1400:
Optical Fabrication and Testing
Manfred Lorenzen; Duncan R. J. Campbell; Craig Johnson, Editor(s)

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