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Proceedings Paper

Superresolution in scanning fluorescence microscopy by means of image processing in the optical domain
Author(s): U. Brand; J. Grochmalicki; G. Hester; I. Akduman; Edward Roy Pike
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Paper Abstract

We present a new technique in scanning fluorescence microscopy with high-NA lenses that offers improved resolution over confocal imaging modes by employing new optical masks. The pattern of this 2D element, which both reflects and transmits the light in the final image plane into subsequent detectors, is calculated by a singular value decomposition of the imaging operator. It brings about instant optical processing to extend the effective bandwidth of the transfer function clearly beyond that of the confocal microscope and leads to a resolution enhancement of up to 50%. We describe the development of the mask along with theoretical results.

Paper Details

Date Published: 6 December 1996
PDF: 12 pages
Proc. SPIE 2926, Optical Biopsies and Microscopic Techniques, (6 December 1996); doi: 10.1117/12.260799
Show Author Affiliations
U. Brand, King's College London (United Kingdom)
J. Grochmalicki, King's College London (United Kingdom)
G. Hester, King's College London (United Kingdom)
I. Akduman, King's College London (United Kingdom)
Edward Roy Pike, King's College London (United Kingdom)


Published in SPIE Proceedings Vol. 2926:
Optical Biopsies and Microscopic Techniques
Irving J. Bigio; Warren S. Grundfest; Herbert Schneckenburger; Katarina Svanberg; Pierre M. Viallet, Editor(s)

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