Share Email Print
cover

Proceedings Paper

Image acquisition and calibration methods in quantitative confocal laser scanning microscopy
Author(s): Bernd Rinke; Joachim Bradl; Peter Edelmann; Bernhard Schneider; Michael Hausmann; Christoph G. Cremer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Quantitative measurements in far field light microscopy are complicated by the different lateral and axial resolutions. For principle reasons the spatial resolution in the direction of the optical axis is lower than in the focal plane. To overcome these limitations, we have developed a 2(pi) -tilting device for full specimen rotation perpendicular to the optical axis. Due to the influence of specimen and mounting media on the spatial resolution of a CLSM, the focal shift increases with the refractive index mismatch and the depth of the investigated region. Attenuation and absorption effects of excitation and emitted light due to layer thickness and refractive index mismatches have to be considered. By means of a capillary with a square shaped cavity in combination with the tilting device, it may become possible to directly calibrate the confocal system in the direction of the optical axis. With this technique it is possible to test 3D deconvolution and segmentation procedures applied to the same object acquired under different perspectives.

Paper Details

Date Published: 6 December 1996
PDF: 11 pages
Proc. SPIE 2926, Optical Biopsies and Microscopic Techniques, (6 December 1996); doi: 10.1117/12.260796
Show Author Affiliations
Bernd Rinke, Univ. of Heidelberg (Germany)
Joachim Bradl, Univ. of Heidelberg (Germany)
Peter Edelmann, Univ. of Heidelberg (Germany)
Bernhard Schneider, Univ. of Heidelberg (Germany)
Michael Hausmann, Univ. of Heidelberg (Germany)
Christoph G. Cremer, Univ. of Heidelberg (Germany)


Published in SPIE Proceedings Vol. 2926:
Optical Biopsies and Microscopic Techniques
Irving J. Bigio; Warren S. Grundfest; Herbert Schneckenburger; Katarina Svanberg; Pierre M. Viallet, Editor(s)

© SPIE. Terms of Use
Back to Top