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Proceedings Paper

Scanning near-field optical/atomic-force microscopy for biomedical applications
Author(s): Eiichi Tamiya; Shinichiro Iwabuchi; Yuji Murakami; Toshifumi Sakaguchi; Kenji Yokoyama; Norio Chiba; Hiroshi Muramatsu
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Paper Abstract

We have developed scanning near-field optical/atomic force microscopy (SNOM/AFM). The SNOM/AFM uses a bent optical fiber simultaneously as a dynamic force AFM cantilever and a SNOM probe. Resonant frequency of the optical fiber cantilever is 15 - 40 kHz. Optical resolution of the SNOM/AFM images shows less than 50 nm. The SNOM/AFM system contains photon counting system and polychrometer/ICCD system to observe fluorescence image and spectrograph of micro areas, respectively. A SNOM-AFM system was newly applied to analyses of biological samples. In this system a feedback signal from AFM in the noncontact mode was used to scan the probe tip along the surface contour of the sample. An optical fiber with a sharp tip on one end was bent for use as cantilever, and ac amplitude of the cantilever deflection was held constant during scanning by moving the stage. Green fluorescent protein (GFP) absorbs blue light and emits green light. GFP should be a convenient indicator of transformation and one that could allow cells to be separated with fluorescence-activated cell sorting. The gene coding to GFP was cloned in recombinant E.coli and plant cells. Spatial distribution of GFP gene expression was clarified using a SNOM-AFM system. Fluorescent spectroscopic analyses supported GFP was surely produced in E.coli and plant cells. Applications to gene identification in human genomes were also discussed.

Paper Details

Date Published: 10 December 1996
PDF: 4 pages
Proc. SPIE 2836, Chemical, Biochemical, and Environmental Fiber Sensors VIII, (10 December 1996); doi: 10.1117/12.260586
Show Author Affiliations
Eiichi Tamiya, Japan Advanced Institute of Science and Technology (Japan)
Shinichiro Iwabuchi, Japan Advanced Institute of Science and Technology (Japan)
Yuji Murakami, Japan Advanced Institute of Science and Technology (Japan)
Toshifumi Sakaguchi, Japan Advanced Institute of Science and Technology (Japan)
Kenji Yokoyama, Japan Advanced Institute of Science and Technology (Japan)
Norio Chiba, Seiko Instruments Inc. (Japan)
Hiroshi Muramatsu, Seiko Instruments Inc. (Japan)


Published in SPIE Proceedings Vol. 2836:
Chemical, Biochemical, and Environmental Fiber Sensors VIII
Robert A. Lieberman, Editor(s)

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