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Proceedings Paper

Characterization of laser optics
Author(s): Jean M. Bennett
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Paper Abstract

Characterization techniques that are appropriate for detecting surface topographic features on ultra-smooth laser optics are described. Thee include various types of microscopes, optical and mechanical profilers, and instruments to measure light scattering. Two special techniques are emphasized -- total internal reflection microscopy (TIRM) and scanning force microscopy (SFM). The importance of keeping laser optics contamination-free is emphasized.

Paper Details

Date Published: 20 November 1996
PDF: 5 pages
Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); doi: 10.1117/12.259941
Show Author Affiliations
Jean M. Bennett, Michaelson Lab./Naval Air Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 2870:
Third International Workshop on Laser Beam and Optics Characterization
Michel Morin; Adolf Giesen, Editor(s)

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