Share Email Print
cover

Proceedings Paper

S on 1 laser damage measurements on CO2-laser optics: defect- and stress-induced damage
Author(s): Wilfried Plass; Adolf Giesen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Two different damage mechanisms are observed in laser damage experiments in the long-pulse regime for coated metal mirrors, partial reflectors and transmissive windows. These damage mechanisms can be distinguished by their time of damage behavior and are interpreted as induced by either defects or stresses in the coating. For both mechanisms, analytical calculations of the temperature evolution show a good agreement with the experimental data. Some samples show both damage mechanisms. The separation of these mechanisms by the time of damage analysis is used to study degradation effects due to an S on 1 irradiation. The experiments show that the defect induced damage threshold is in most cases independent of S, while the threshold of the stress induced damage decreases in a first approximation logarithmically with S. The integration of the Nomarski-microscope in the experimental setup allows for an effective evaluation of the experimental data according to the damage probability method of the ISO-standard ISO-DIS 11254-2. Microscopic inspection reveals noncumulative damage phenomena during S on 1 testing, which may prohibit the use of non-microscopic online detection techniques.

Paper Details

Date Published: 20 November 1996
PDF: 8 pages
Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); doi: 10.1117/12.259930
Show Author Affiliations
Wilfried Plass, Institut fuer Strahlwerkzeuge/Univ. Stuttgart (Germany)
Adolf Giesen, Institut fuer Strahlwerkzeuge/Univ. Stuttgart (Germany)


Published in SPIE Proceedings Vol. 2870:
Third International Workshop on Laser Beam and Optics Characterization
Michel Morin; Adolf Giesen, Editor(s)

© SPIE. Terms of Use
Back to Top