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Proceedings Paper

Aging tests of high-power diode lasers as a basis for an international lifetime standard
Author(s): Friedhelm Dorsch; Franz X. Daiminger
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Paper Abstract

Higher power laser diodes have been aged under various operating conditions to gain information on the long-term output power behavior. In particular, the degradation of cw diode lasers that are operated at constant output power or at a constant driving current are compared to each other. It turns out that the lifetime results and their comparability strongly depend on the 'end-of-life' criterion. Especially for constant power operation extrapolation of the lifetime for longer intervals might give inconsistent results if the degradation of threshold current and slope efficiency are not known. Aging tests at increased temperature have been performed to investigate whether accelerated lifetime tests give reliable results to estimate lifetime and degradation rate at nominal operating conditions.

Paper Details

Date Published: 20 November 1996
PDF: 9 pages
Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); doi: 10.1117/12.259922
Show Author Affiliations
Friedhelm Dorsch, Jenoptik Laserdiode GmbH (Germany)
Franz X. Daiminger, Jenoptik Laserdiode GmbH (Germany)

Published in SPIE Proceedings Vol. 2870:
Third International Workshop on Laser Beam and Optics Characterization
Michel Morin; Adolf Giesen, Editor(s)

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