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Proceedings Paper

Surface-emitting laser diode beam characterization (Abstract Only)
Author(s): Richard D. Jones; Gregory E. Obarski; David J. Livigni; Holger Laabs
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Paper Abstract

We have conducted thorough analysis of a vertical-cavity surface-emitting laser (VCSEL) diode which produces TEM01* (donut) and higher-order modes. Our analysis includes the following quantities as a function of drive current: optical power, spectral content, relative intensity noise (RIN) up to 100 MHz, and beam characterization parameters. While this VCSEL produces higher-order modes which are not affected by optical feedback, its optical power (0.05 mW for TEM01*), long term stability, and sensitivity to collimating lens position make it a doubtful candidate for use in a beam characterization round robin. Also, we hope to present recently acquired data from the diode-pumped tunable transverse mode laser developed in Berlin and tested at NIST.

Paper Details

Date Published: 20 November 1996
PDF: 1 pages
Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); doi: 10.1117/12.259921
Show Author Affiliations
Richard D. Jones, National Institute of Standards and Technology (United States)
Gregory E. Obarski, National Institute of Standards and Technology (United States)
David J. Livigni, National Institute of Standards and Technology (United States)
Holger Laabs, Optisches Institut/Technische Univ. Berlin (Germany)


Published in SPIE Proceedings Vol. 2870:
Third International Workshop on Laser Beam and Optics Characterization
Michel Morin; Adolf Giesen, Editor(s)

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