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Proceedings Paper

Capillary concentrators for synchrotron radiation beamlines
Author(s): Steve M. Heald; Dale L. Brewe; Kyungha H. Kim; Frederick C. Brown; Bill Barg; Edward A. Stern
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Paper Abstract

Capillary concentrators condense x-rays by multiple reflections down a gradually tapering capillary. They can provide sub-micron beam spots, and are promising candidates for use in the next generation x-ray microprobe beamlines. The weak energy dependence of their properties make them especially useful for energy scanning applications such as micro-XAFS. This paper examines the potential performance of capillary optics for an x-ray microprobe, as well as some practical issues such as fabrication and alignment. Best performance at third generation sources requires long capillaries, and we have been using fiber optics techniques to fabricate capillaries up to one meter in length. The performance of shorter (less than about 0.5 m) capillaries has often been found to agree well with the theoretical calculations, indicating the inner surface is a high quality x-ray reflector. These capillaries have been tested at the NSLS for imaging and micro-XAFS down to 2.6 micrometers resolution with excellent results. On an unfocused bend magnet line flux density approaching 106 ph/sec/micrometers 2 has been achieved. While nearly optimum profiles have been achieved for longer capillaries, the results have been disappointing, and alignment problems are suspected. The dramatic improvement in performance possible at third generation synchrotrons such as the APS is discussed along with improvements possible by using the capillaries in conjunction with coupling optics.

Paper Details

Date Published: 22 November 1996
PDF: 12 pages
Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); doi: 10.1117/12.259883
Show Author Affiliations
Steve M. Heald, Pacific Northwest National Lab. (United States)
Dale L. Brewe, Univ. of Washington (United States)
Kyungha H. Kim, Univ. of Washington (United States)
Frederick C. Brown, Univ. of Washington (United States)
Bill Barg, Univ. of Washington (United States)
Edward A. Stern, Univ. of Washington (United States)


Published in SPIE Proceedings Vol. 2856:
Optics for High-Brightness Synchrotron Radiation Beamlines II
Lonny E. Berman; John Arthur, Editor(s)

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