Share Email Print

Proceedings Paper

Advantages of in-situ LTP distortion profile test on high heat load mirrors and applications
Author(s): Shinan Qian; Werner H. Jark; Giovanni Sostero; Alessandro Gambitta; Fabio Mazzolini; Adolfo Savoia
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The first in-situ distortion profile measurement of a high heat load mirror by use of the penta-prism LTP is presented. A maximum height distortion of 0.47 micron in tangential direction over a length of 180 mm was measured for an internally water-cooled mirror of a undulator beam line at ELETTRA while exposed to a total emitted power of 600 W (undulator gap 30 mm and current 180 mA). The experiment has an accuracy and repeatability of 0.04 micron. The test schematic and the test equipment are presented. Two measuring methods to scan a penta-prism being installed either outside or inside the vacuum chamber are introduced. Advantages and some possible applications of adopting the penta-prism LTP to make the in-situ profile test are explained.

Paper Details

Date Published: 22 November 1996
PDF: 11 pages
Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); doi: 10.1117/12.259870
Show Author Affiliations
Shinan Qian, Sincrotrone Trieste (United States)
Werner H. Jark, Sincrotrone Trieste (Italy)
Giovanni Sostero, Sincrotrone Trieste (Italy)
Alessandro Gambitta, Sincrotrone Trieste (Italy)
Fabio Mazzolini, Sincrotrone Trieste (Italy)
Adolfo Savoia, Sincrotrone Trieste (Italy)

Published in SPIE Proceedings Vol. 2856:
Optics for High-Brightness Synchrotron Radiation Beamlines II
Lonny E. Berman; John Arthur, Editor(s)

© SPIE. Terms of Use
Back to Top