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Proceedings Paper

Design of a high-resolution step-and-scan type monochromator capable of tuning to undulator radiation over a wavelength range of 80-180 nm
Author(s): Masato Koike; Philip A. Heimann; Takeshi Namioka
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Paper Abstract

A step-and-scan type scanning scheme has been investigated for the purpose of simplifying the high-precision scanning mechanism adopted in the 6.65-m off-plane Eagle type monochromator on an undulator beamline of the Advanced Light Source at Lawrence Berkeley National Laboratory. In this scheme it is proposed to scan over a wavelength range of 80 - 180 nm by covering a range of 0.99 (lambda) t - 1.01 (lambda) t at a time by simply rotating the grating fixed at the position for a wavelength (lambda) t to which the undulator is tuned. When the undulator is tuned to another (lambda) t, the grating is translated to a new fixed position and scanning is made by simple grating rotation. A ruled grating with varied line spacing and straight grooves and a holographic grating recorded with spherical wave- fronts were designed to match the proposed scanning scheme and to meet the required energy resolution of approximately 1.0 cm-1 over the entire scanning range. The results of ray tracing show that the designed gratings with 2400 grooves/mm and 6.1-m radius of curvature would provide a resolution of -1, a good correction of astigmatism, and a grating travel distance of only 11 or 14 mm over the scanning range of 80 - 180 nm.

Paper Details

Date Published: 22 November 1996
PDF: 7 pages
Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); doi: 10.1117/12.259861
Show Author Affiliations
Masato Koike, Lawrence Berkeley National Lab. (United States)
Philip A. Heimann, Lawrence Berkeley National Lab. (United States)
Takeshi Namioka, Office of Naval Research (Japan)


Published in SPIE Proceedings Vol. 2856:
Optics for High-Brightness Synchrotron Radiation Beamlines II
Lonny E. Berman; John Arthur, Editor(s)

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