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Proceedings Paper

Monolithic silicon x-ray interferometer with varying mirror-analyzer spacing for the analysis of beam coherence
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Paper Abstract

A Laue-Laue-Laue x-ray interferometer with the inclined third crystal plate was fabricated to demonstrate wavefront- dividing interferometry in x-ray region. Observed interference patterns showed the effects of spatial coherence of the incident wave, in addition to the incident angle dependent spatial fringes expected from the dynamical theory of diffraction. From the visibility of the interference pattern, the source size used was estimated using Van Cittert-Zernike theorem.

Paper Details

Date Published: 22 November 1996
PDF: 10 pages
Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); doi: 10.1117/12.259859
Show Author Affiliations
Hiroshi Yamazaki, Univ. of Tokyo and JAERI-RIKEN Joint Project Team/SPring-8 (Japan)
Tetsuya Ishikawa, Univ. of Tokyo and JAERI-RIKEN Joint Project Team/SPring-8 (Japan)


Published in SPIE Proceedings Vol. 2856:
Optics for High-Brightness Synchrotron Radiation Beamlines II
Lonny E. Berman; John Arthur, Editor(s)

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