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Proceedings Paper

Technology enablers for improved aerospace x-ray NDE
Author(s): George Strabel; Joseph Ross; Larry Graham; Kevin Smith
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Paper Abstract

In the current climate of reduced Military spending and lower commercial demand for aerospace products, it is of critical importance to allocate scarce technology development resources to meet projected needs. During the past decade, dramatic advances in x-ray nondestructive evaluation (NDE) technology have results in commercially viable digital radiography (DR) and computed tomography (CT) systems. X-ray CT has become an important NDE technique that not only provides data about material integrity, but also valuable volumetric data which is finding applications in reverse engineering, rapid prototyping, process control and 3D metrology. Industrial DR and CT systems have been available for almost 10 years, but are very costly, generally designed for specific applications and have well known limitations for both process development and final inspection. They have inadequate energy/flux to penetrate many large components and structures. In order to support the US Aerospace Industry in its drive towards global competitiveness, it is imperative that key enabling tools such as DR and CT be improved, made affordable, and implemented to meet the anticipated needs of the next decade of aerospace applications. This paper describes a strategy for a consortium of suppliers and users of x-ray NDE systems, academia and national laboratories to work together to attain this goal.

Paper Details

Date Published: 15 November 1996
PDF: 10 pages
Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); doi: 10.1117/12.259205
Show Author Affiliations
George Strabel, Howmet Corp. (United States)
Joseph Ross, GE Aircraft Engines (United States)
Larry Graham, Precision Castparts Corp. (United States)
Kevin Smith, Pratt and Whitney (United States)


Published in SPIE Proceedings Vol. 2948:
Nondestructive Evaluation for Process Control in Manufacturing
Richard H. Bossi; Tom Moran, Editor(s)

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