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Proceedings Paper

CT-assisted metrology for manufacturing applications
Author(s): Robert N. Yancey; Dennis S. Eliasen; Roosevelt Gibson; Robert Dzugan
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Paper Abstract

Computed tomography (CT) has been shown to be an excellent nondestructive evaluation tool for measuring internal and external dimensions of manufactured components. Recent advances in CT-based metrology allow for CT data to be processed efficiently to produce full 3D models of scanned parts. This paper will talk about a number of applications for this technology including linking CT with rapid prototyping methods, using CT and rapid prototyping to produce rapid tooling, using CT as a metrology tool in a production environment, and linking CT data with engineering analysis. The paper will provide an overview of the current state of the art in applying CT-based metrology to manufacturing applications, will discuss actual application case studies, and highlight areas for future work in this area.

Paper Details

Date Published: 15 November 1996
PDF: 10 pages
Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); doi: 10.1117/12.259203
Show Author Affiliations
Robert N. Yancey, Advanced Research and Applications Corp. (United States)
Dennis S. Eliasen, Advanced Research and Applications Corp. (United States)
Roosevelt Gibson, Advanced Research and Applications Corp. (United States)
Robert Dzugan, Edison Materials Technology Ctr. (United States)


Published in SPIE Proceedings Vol. 2948:
Nondestructive Evaluation for Process Control in Manufacturing
Richard H. Bossi; Tom Moran, Editor(s)

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