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Proceedings Paper

Measurement of thickness and elastic properties of electroactive polymer films using plate wave dispersion data
Author(s): Yoseph Bar-Cohen; Shyh-Shiuh Lih; Anter El-Azab; Ajit K. Mal
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Paper Abstract

In this paper, an ongoing investigation of plate wave dispersion measurement as a technique for indirect determination of the elastic properties and thickness of electroactive thin film polymers is described. Three polymer films were tested: a 1 mm thick s-PMMA film, and 80 micrometers and 230 micrometers thick polyethylene terephthalate films. The dispersion curves are measured, and a numerical algorithm is applied to recover the thickness and elastic constants of these films. Preliminary results show that the technique can be a viable gauging tool for electroactive thin film polymers.

Paper Details

Date Published: 15 November 1996
PDF: 6 pages
Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); doi: 10.1117/12.259187
Show Author Affiliations
Yoseph Bar-Cohen, Jet Propulsion Lab. (United States)
Shyh-Shiuh Lih, Jet Propulsion Lab. (United States)
Anter El-Azab, Univ. of California/Los Angeles (United States)
Ajit K. Mal, Univ. of California/Los Angeles (United States)


Published in SPIE Proceedings Vol. 2948:
Nondestructive Evaluation for Process Control in Manufacturing
Richard H. Bossi; Tom Moran, Editor(s)

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