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Proceedings Paper

Some experience using noncontact sensors on airport pavements
Author(s): Carl A. Lenngren
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Paper Abstract

The Swedish National Road Administration has been using a laser based system for assessing pavement surface characteristics for over a decade. Typically, important distress data like roughness and rutting are being sampled at speeds up to 25 meters per second. Other parameters include textures and geometric data, such as cross slope and curvature. The Royal Swedish Fortifications Administration has just recently looked into these techniques for airfield pavements. The objectives are similar but not exactly the same as for highway pavements. A promising aspect is using data for building terrain models of the surface so that overlay design procedures can take place in a computerized environment. The objectives are similar but not exactly the same as for highway pavements. A promising aspect is using data for building terrain models of the surface so that overlay design procedures can take place in a computerized environment. Two different ways of treating the data for this purpose was tried. One model uses several parallel continuous longitudinal profiles. The other consists of snap-shot transverse profiles at five meter intervals. The former model yields good assessment of the volumetric needs of either filling or milling operations. The latter is better for identifying features on the surface. The present paper describes some of experiences obtained with the two methods. However, in both cases the most advantageous aspect of using the non-contact devices is the short time needed for collecting the data.

Paper Details

Date Published: 14 November 1996
PDF: 11 pages
Proc. SPIE 2945, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware, (14 November 1996); doi: 10.1117/12.259099
Show Author Affiliations
Carl A. Lenngren, VV Consult (Sweden)


Published in SPIE Proceedings Vol. 2945:
Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware
Raymond D. Rempt; Alfred L. Broz, Editor(s)

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