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Proceedings Paper

Residual stress measurement by laser annealing and speckle interferometry
Author(s): James E. Millerd; James D. Trolinger; Chandra S. Vikram; Martin J. Pechersky
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Paper Abstract

We present a design for a compact residual stress measurement sensor based on laser annealing and laser speckle interferometry. The instrument integrates laser diodes, holographic optical elements, a compact CO2 laser, and advanced data reduction techniques to provide quantitative measurements. In this paper we present a review of residual stress measurement using laser annealing, details of our design and preliminary measurement data.

Paper Details

Date Published: 14 November 1996
PDF: 9 pages
Proc. SPIE 2945, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware, (14 November 1996); doi: 10.1117/12.259080
Show Author Affiliations
James E. Millerd, MetroLaser, Inc. (United States)
James D. Trolinger, MetroLaser, Inc. (United States)
Chandra S. Vikram, Univ. of Alabama in Huntsville (United States)
Martin J. Pechersky, Westinghouse (WSRC) (United States)


Published in SPIE Proceedings Vol. 2945:
Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware
Raymond D. Rempt; Alfred L. Broz, Editor(s)

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