Share Email Print
cover

Proceedings Paper

Computerized detection and identification of the types of defects on crystal blanks
Author(s): Sing T. Bow; Pei Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

To assure quality in crystal production detection of the defects especially cracks and scratches is a vital task. Up to the present inspection operation on crystal blanks is still being carried out with naked eyes under an optical magnifier. Due to the tiresomeness or unconscientiousness which might result from the continual exposure to strong illumination the misclassification rate will unavoidably be high. Noting that the degree of the seriousness of cracks and scratches are different part of the defected crystal blanks (mainly those with scratches) could be retrieved to increase the productivity rate. In this paper a criterion is established to precisely defme the fme scratches and cracks based on the data collected from large amount of crystal blank samples which are known to contain cracks and/or scratches and algorithms are developed to automate the detection and defect-category identification. THE PROBLEM Automated inspection has been a very popular topic during the past twenty years not only in research and development but has already been put into practical use. A lot of successful experience has been obtained in modern factories in detecting the imperfection of the parts In many cases the computerized inspection coordinates very well with robotics and becomes an important link in the intergrated manufactured system. However in our crystal manufacturing industry such a development is completely new. As we know crystal products have widely been used. It has already

Paper Details

Date Published: 1 March 1991
PDF: 10 pages
Proc. SPIE 1396, Applications of Optical Engineering: Proceedings of OE/Midwest '90, (1 March 1991); doi: 10.1117/12.25868
Show Author Affiliations
Sing T. Bow, Northern Illinois Univ. (United States)
Pei Chen, Northern Illinois Univ. (United States)


Published in SPIE Proceedings Vol. 1396:
Applications of Optical Engineering: Proceedings of OE/Midwest '90
Rudolph P. Guzik; Hans E. Eppinger; Richard E. Gillespie; Mary Kathryn Dubiel; James E. Pearson, Editor(s)

© SPIE. Terms of Use
Back to Top