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Proceedings Paper

Temperature effects on reflectance and emittance measurements of Martin Black and Enhanced Martin Black surfaces
Author(s): Andrew L. Shumway; Donald F. Shepard; Russel E. Clement; Paul McKenna
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Paper Abstract

Martin Black and enhanced Martin Black samples were heated above 620 K and also cooled to 77 K while the directional reflectance and emittance were measured in the spectral region of 1.35 to 26 micrometer. Little emittance variation was found for both surfaces below 300 K. From 77 K to 315 K Martin Black emittance was 98.5% or greater from 7.5 to 24 micrometer. Similarly, enhanced Martin Black emittance was 96% or greater. Furthermore, these conditions apply up to 620 K. Significant reflectance variations below 7.5 micrometer were observed at ambient temperature after baking samples at 620 K both in air and vacuum environments. Reflectance variations as a function of temperature from 300 to 620 K were measured. Humidity and vacuum exposure effects on the surface reflectance properties were also investigated. Post-backed sample reflectance near 5 micrometer was extremely sensitive to ambient air exposure.

Paper Details

Date Published: 11 November 1996
PDF: 20 pages
Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); doi: 10.1117/12.258330
Show Author Affiliations
Andrew L. Shumway, Utah State Univ. (United States)
Donald F. Shepard, Lockheed Martin Astronautics (United States)
Russel E. Clement, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Paul McKenna, Surface Optics Corp. (United States)

Published in SPIE Proceedings Vol. 2864:
Optical System Contamination V, and Stray Light and System Optimization
Robert P. Breault; A. Peter M. Glassford; Stephen M. Pompea; Robert P. Breault; Stephen M. Pompea, Editor(s)

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