Share Email Print
cover

Proceedings Paper

Ascent-phase particle-contamination modeling using finite-element methods
Author(s): David A. Brent; Dorothy Gor; Kelly A. Henderson; Brian K. Blakkolb
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper describes a finite-element numerical approach for predicting the time-dependent particulate motion of released particulate that complements the standard particulate redistribution model for predicting contamination levels of exposed payload surfaces during the ascent-phase. The particulate redistribution model is used to give a spatially and time averaged estimate of the contamination level during ascent that is considered to be very conservative. All particulates are assumed to be retained in the fairing/payload volume with none venting out of the volume. The new numerical model takes more comprehensive approach and attempts to estimate the time-dependent particulate surface-impingement flux by considering the key physical mechanisms believed to govern the gas/particulate transport problem. It solves the time-dependent fairing/payload gas transport (venting) and particulate transport problem during the ascent-phase. The gas transport model is used only up to point where gas flow no longer significantly impacts the partiality motion. Thus, only the continuum fluid regime is considered in the model. It is possible to treat particulate release beyond this point, but it has not been considered in the modeling effort described in this paper. Booster acceleration, gas motion during venting and particulate drag (due to gas flow) are treated. Released particulate trajectories and particulate impingement fluxes are predicted, and subsequent surface contamination levels are estimated. Results are presented for both Pegasus/TOMS and EOS during ascent. The final contamination levels predicted are considered to be the initial on-orbit particulate contamination levels.

Paper Details

Date Published: 11 November 1996
PDF: 8 pages
Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); doi: 10.1117/12.258301
Show Author Affiliations
David A. Brent, TRW Space & Electronics Group (United States)
Dorothy Gor, TRW Space & Electronics Group (United States)
Kelly A. Henderson, TRW Space & Electronics Group (United States)
Brian K. Blakkolb, TRW Space & Electronics Group (United States)


Published in SPIE Proceedings Vol. 2864:
Optical System Contamination V, and Stray Light and System Optimization
Robert P. Breault; Stephen M. Pompea; A. Peter M. Glassford; Robert P. Breault; Stephen M. Pompea, Editor(s)

© SPIE. Terms of Use
Back to Top