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Proceedings Paper

MODIS Airborne Simulator radiometric calibration
Author(s): G. Thomas Arnold; Mike T. Fitzgerald; Patrick S. Grant; Steven E. Platnick; Si Chee Tsay; Jeffrey S. Myers; Michael D. King; Robert O. Green; Lorraine A. Remer
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Paper Abstract

Over the past few years, the MODIS airborne simulator (MAS) has been providing imagery for EOS scientific algorithm development. Primarily flown aboard NASA's ER-2 aircraft, the MAS provides high spatial resolution (50 m at nadir) in 50 spectral channels from 0.55 to 14.2 micrometer, overlapping many MODIS and ASTER channels. This paper focuses on calibration of the short-wave (0.55 - 2.38 micrometer) channels, both radiometric and spectral, and calibration of the integrating sources. Also discussed is the dependence of the short-wave calibration on instrument temperature, showing significant reduction in the thermal sensitivity after recent instrument enhancements and upgrades. The procedures for intercomparison of MAS and AVIRIS (airborne visible/infrared imaging spectrometer) data are also discussed. Some limited comparisons for flights over Alaska (June 1995) are presented, although this analysis is in its initial stages and quantitative results are preliminary.

Paper Details

Date Published: 11 November 1996
PDF: 11 pages
Proc. SPIE 2820, Earth Observing System, (11 November 1996); doi: 10.1117/12.258115
Show Author Affiliations
G. Thomas Arnold, Applied Research Corp. (United States)
Mike T. Fitzgerald, U.S. Army Tank-Automotive Command (United States)
Patrick S. Grant, Loral CCD Imaging Systems (United States)
Steven E. Platnick, Research and Data Systems Corp. (United States)
Si Chee Tsay, NASA Goddard Space Flight Ctr. (United States)
Jeffrey S. Myers, U.S. Army Tank-Automotive Command (United States)
Michael D. King, NASA Goddard Space Flight Ctr. (United States)
Robert O. Green, NASA Goddard Space Flight Ctr. (United States)
Lorraine A. Remer, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 2820:
Earth Observing System
William L. Barnes, Editor(s)

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