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Proceedings Paper

Optical system for real-time web-process defect inspection
Author(s): James S. Harris
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Paper Abstract

The results of a program to develop a low-cost, real-time approach for 100 percent inspection of fast-moving process lines for textures, paper, and steel are reported. Initial results will be described of a laser based scanning system that uses a neural network for training and the implementation of a neural network with an optical processor for real-time defect inspection.

Paper Details

Date Published: 31 October 1996
PDF: 8 pages
Proc. SPIE 2908, Machine Vision Applications, Architectures, and Systems Integration V, (31 October 1996); doi: 10.1117/12.257267
Show Author Affiliations
James S. Harris, Rockwell Automation/Reliance Electric Corp. (United States)

Published in SPIE Proceedings Vol. 2908:
Machine Vision Applications, Architectures, and Systems Integration V
Susan Snell Solomon; Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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